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AFM

 

 Click for more images: Atomic Force Microscope (AFM)

 

 

 

 

 

 

 

Atomic Force Microscope (AFM)

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The precursor to the AFM, the scanning tunneling microscope, was developed by Gerd Binnig and Heinrich Rohrer in the early 1980s at IBM Research – Zurich, a development that earned them the Nobel Prize for Physics in 1986. Binnig invented the atomic force microscope (also abbreviated as AFM) and the first experimental implementation was made by Binnig, Quate and Gerber in 1986. The first commercially available atomic force microscope was introduced in 1989. The AFM is one of the foremost tools for imaging, measuring, and manipulating matter at the nanoscale. The information is gathered by “feeling” the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable the very precise scanning. In some variations, electric potentials can also be scanned using conducting cantilevers. In more advanced versions, currents can be passed through the tip to probe the electrical conductivity or transport of the underlying surface, but this is much more challenging with few research groups reporting consistent data (as of 2004).

(Source: Wikipedia)

 

  Click for more images: Atomic Force Microscope (AFM)

 

 

  How AFM Works: AFM Principle

http://www.parkafm.com/index.php/medias/nano-academy/how-afm-works

AFM Modes and Techniques

http://www.parkafm.co.kr/index.php/kr/products/modes-options/park-afm-modes

(Source: Park Systems)

  

 

 

 

– Kwangwoon University –

Advanced Quantum-Nano Materials & Optoelectronics Laboratory

 

– University of Arkansas –

 

– Funding Agency & Centers –

– Journal Editorials –

 

Editorial Board Nanoscale Research Letters * IF 3.125 (JCR 2018) Springer New York, USA
Editorial Board Nanoscale Research Letters * IF 3.125 (JCR 2018) Springer New York, USA

 

Special Issue Editor Nanomaterials *IF 4.043 (JCR 2018) MDPI Basel, Switzerland
Special Issue Editor Nanomaterials *IF 4.043 (JCR 2018) MDPI Basel, Switzerland

 

Managing Editor 3D RESEARCH * ESCI, SCOPUS Springer New York, USA
Managing Editor 3D RESEARCH * ESCI, SCOPUS Springer New York, USA

– Research Highlight –

 

Journal Cover: Advanced Materials Interfaces Volume 8 Issue 21 (2021)

 

(Journal cover, The Journal of Physical Chemistry C) Volume 123 Issue 4 (2019)
(Journal cover, The Journal of Physical Chemistry C) Volume 123 Issue 4 (2019)

 

(Journal cover, Journal of Nanoelectronics and Optoelectronics) Volume 13 Issue 6 (2018)
(Journal cover, Journal of Nanoelectronics and Optoelectronics) Volume 13 Issue 6 (2018)

 

Journal cover, Metals Volume 7 Issue 11 (2017)
(Journal cover, Metals) Volume 7 Issue 11 (2017)

 

(Journal cover, CrystEngComm) Volume 18 Issue 19 (2016)
(Journal cover, CrystEngComm) Volume 18 Issue 19 (2016)

 

(Journal cover, CrystEngComm) Volume 16 Issue 21 (2014)
(Journal cover, CrystEngComm) Volume 16 Issue 21 (2014)

 

(Journal cover, Physica Status Solidi (a)) Volume 209 Issue 6 (2012)
(Journal cover, Physica Status Solidi (a)) Volume 209 Issue 6 (2012)

 

(Journal cover, Physica Status Solidi (a)) Volume 208 Issue 1 (2011)
(Journal cover, Physica Status Solidi (a)) Volume 208 Issue 1 (2011)

 

(Journal cover, IEEE Transactions on Nanotechnology) Volume 9 Issue 2 (2010)
(Journal cover, IEEE Transactions on Nanotechnology) Volume 9 Issue 2 (2010)

 

(Materials Views, Wiley's Material Science) "Nano Rings and Nano Pyramids" (2010)
(Materials Views, Wiley’s Material Science) “Nano Rings and Nano Pyramids” (2010)
(Journal cover, Physica Status Solidi (a) Volume 207 Issue 2 (2010)
(Journal cover, Physica Status Solidi (a) Volume 207 Issue 2 (2010)

 

(Journal cover, Applied Physics Letters) Volume 89 Issue 20 (2006)
(Journal cover, Applied Physics Letters) Volume 89 Issue 20 (2006)

 

(2006 MRS Fall Meeting Scene) "Self-Assembly of InGaAs Quantum Dot Molecules (QDMs)" (2006)
(2006 MRS Fall Meeting Scene) “Self-Assembly of InGaAs Quantum Dot Molecules (QDMs)” (2006)

 

(Journal cover, Applied Physics Letters) Volume 88 Issue 23 (2006)
(Journal cover, Applied Physics Letters) Volume 88 Issue 23 (2006)

 

(NanoWerk, Spotlight) "Quantum dot necklaces and other QD chains" (April 12, 2006)
(NanoWerk, Spotlight) “Quantum dot necklaces and other QD chains” (April 12, 2006)

 

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