Click for more images: At Dr. Salamo’s group
< STM & MBE combined batch system >
(consisting 3 MBEs & 2 STMs & 1 SEM + STM system : Dr. Salamo’s group at U of Arkansas)
< Scanning Electron Microscope (SEM) & Transmission Electron Microscope (TEM) system: Dr. Salamo’s group at U of Arkansas >
Source: Radboud University Nijmegen
< Focussed Ion Beam (FIB) system: Dr. Salamo’s group at U of Arkansas >
How does an FIB work?
Source: IBM
< Fabrication laboratory: Dr. Salamo’s group at U of Arkansas >
< Clean room : HiDEC (The High Density Electronics Center) at U of Arkansas >
Click for more images: At Dr. Salamo’s group